Free Download Synopsys StarRC vY-2026.03 | 5.3 GbStarRC is a high-accuracy parasitic extraction solution developed by Synopsys for digital and custom integrated circuit (IC) design, implementation, and signoff verification. It calculates parasitic resistance and capacitance associated with chip interconnects, providing essential electrical data for evaluating circuit behavior and verifying design performance.
The software is used by semiconductor engineers working on system-on-chip (SoC), custom digital, analog and mixed-signal, memory, and three-dimensional integrated circuit (3D IC) designs. By extracting interconnect parasitics from physical design data, StarRC supports downstream analysis and signoff workflows where accurate modeling of electrical effects is important.
StarRC is part of the Synopsys Digital Design and Custom Design software families. It supports modeling of physical effects associated with advanced semiconductor process technologies and integrates with digital and custom implementation environments, physical verification, timing analysis, signal integrity, power analysis, thermal analysis, and circuit simulation workflows.
Parasitic extraction is an essential stage in semiconductor design because the resistance and capacitance of interconnect structures can affect signal timing, power consumption, and circuit behavior. StarRC extracts these electrical characteristics from physical layouts to support more accurate analysis and design signoff.
The software is designed for advanced IC implementation, including designs that use FinFET process technologies at 16 nm, 14 nm, 10 nm, 7 nm, 5 nm, 3 nm, and beyond, as described in the supplied product information. Its extraction capabilities support both digital and custom design flows across several semiconductor application areas.
StarRC also provides Simultaneous Multi-Corner (SMC) extraction technology. This approach allows multiple process, voltage, and temperature corners to be handled within an extraction workflow, helping engineering teams manage computational resources and reduce extraction turnaround time for demanding signoff schedules.
Key Features- High-accuracy parasitic resistance and capacitance extraction for integrated circuits.
- Support for SoC, custom digital, analog/mixed-signal, memory, and 3D IC designs.
- Physical-effect modeling for advanced semiconductor process technologies.
- Support for FinFET technology nodes, including 16 nm, 14 nm, 10 nm, 7 nm, 5 nm, and 3 nm.
- Simultaneous Multi-Corner extraction for multi-corner design analysis workflows.
- Integration with digital and custom IC implementation environments.
- Support for timing analysis and signoff verification workflows.
- Compatibility with signal integrity, power, thermal, and circuit simulation flows.
- Extraction workflows designed to support semiconductor design closure.
Why Choose StarRCStarRC is intended for semiconductor design teams that require accurate interconnect modeling for physical implementation and signoff. Its parasitic extraction results help engineers assess the electrical effects of physical wiring and provide data for downstream timing, signal integrity, and circuit analysis.
The combination of advanced process modeling, multi-corner extraction, and integration with established electronic design automation (EDA) workflows makes StarRC suitable for complex digital and custom IC projects. Simultaneous Multi-Corner extraction can also help teams manage extraction workloads when multiple signoff conditions must be evaluated.
System Requirements- Operating System: Linux *
- Architecture: x86_64
Frequently Asked QuestionsWhat is Synopsys StarRC used for?StarRC extracts parasitic resistance and capacitance from integrated circuit layouts. The resulting data supports timing analysis, signal integrity evaluation, circuit simulation, and IC signoff verification.
Which types of integrated circuit designs does StarRC support?The supplied product information identifies SoC, custom digital, analog/mixed-signal, memory, and 3D IC designs as supported application areas.
What is Simultaneous Multi-Corner extraction?Simultaneous Multi-Corner (SMC) extraction is a StarRC technology designed to handle extraction across multiple design corners within a coordinated workflow. It can help improve extraction turnaround time and make more efficient use of available computing resources.
Why is parasitic extraction important in IC design?Interconnect resistance and capacitance influence electrical behavior, including signal delay and signal integrity. Extracting these parasitic effects helps engineers evaluate physical designs more accurately before signoff.
Which operating system does this release target?The supplied system requirements list Linux * and the x86_64 architecture. A specific Linux distribution and hardware requirements are not provided.
Home Pagewww.synopsys.com
Product Information- Software Name: StarRC
- Version: vY-2026.03
- Architecture: x86_64
- Languages: english
- License type: Full Version
- File Size: 5.3 Gb
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